NIST logo

Publications Portal

You searched on:
Topic Area: Materials Science

Displaying records 11 to 20 of 544 records.
Resort by: Date / Title


11. Proceedings of the Measurement Science for Sustainable Construction and Manufacturing Workshop: Volume 1. Position Papers and Findings
Series: Grant/Contract Reports (NISTGCR)
Topic: Materials Science
Published: 9/26/2014
Authors: Bilal Ayyub, Gerald Galloway, Richard Wright
Abstract: This report documents the effort launched by the National Institute of Standards and Technology (NIST) to develop, organize, and convene a workshop on sustainability to promote the adoption and use of sustainable construction and manufacturing and gu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916761

12. Proceedings of the Measurement Science for Sustainable Construction and Manufacturing Workshop: Volume 2. Presentations
Series: Grant/Contract Reports (NISTGCR)
Topic: Materials Science
Published: 9/26/2014
Authors: Bilal Ayyub, Gerald Galloway, Richard Wright
Abstract: This report documents the effort launched by the National Institute of Standards and Technology (NIST) to develop, organize, and convene a workshop on sustainability to promote the adoption and use of sustainable construction and manufacturing and gu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916764

13. Obstacle Detection and Avoidance from an Automated Guided Vehicle
Topic: Materials Science
Published: 9/18/2014
Authors: Roger V Bostelman, William P Shackleford, Geraldine S Cheok
Abstract: Current automated guided vehicle (AGV) technology typically provides material handling flow along single or dual opposing-flow lanes in manufacturing and distribution facilities. An AGV stops for most any obstacle that may be in its path which then ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915448

14. Multiscale Correlative Measurements of Nanoparticles in Cells
Topic: Materials Science
Published: 8/26/2014
Authors: Aric Warner Sanders, Kavita M Jeerage, Cindi Schwartz, Alexandra E Curtin, Ann Chiaramonti Chiaramonti Debay
Abstract: Nanoparticles are emerging as invaluable tools in disease diagnosis, disease treatment and imaging contrast enhancement agents. The interactions of nanoparticles with host organisms are complex and affect biological systems over length scales that va ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915572

15. Reliability of Low Temperature Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
Topic: Materials Science
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Aric Warner Sanders, Alexandra E Curtin, R. Ishihara, David Thomas Read
Abstract: In this extended abstract we present our recent results on the reliability testing of multi-wall carbon nanotube vertical interconnects (vias).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915382

16. Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel Using Complimentary Atom Probe Tomography and Electron Microscopy
Topic: Materials Science
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Jeffrey W Sowards, James R Fekete
Abstract: We investigated the mechanical properties as a function of isothermal annealing in alloy A710 (HSLA-80) using combined atom probe tomography and transmission electron microscopy.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915365

17. Development of Low Carrier Density Graphene Devices
Topic: Materials Science
Published: 8/1/2014
Authors: Yanfei Yang, Lung-I Huang, David B Newell, Yasuhiro Fukuyama, Mariano A. Real, Randolph E Elmquist
Abstract: Epitaxial graphene on SiC(0001) is used to fabricate Hall bar structures for metrological applications with a fabrication process that has been developed to eliminate organic chemical contamination of the graphene. Before any lithographic patterning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915345

18. Nanoscale Imaging and Spectroscopy of Plasmonic Modes with the PTIR technique
Topic: Materials Science
Published: 8/1/2014
Authors: Aaron Michael Katzenmeyer, Jungseok Chae, Richard J Kasica, Glenn E Holland, Basudev Lahiri, Andrea Centrone
Abstract: The collective oscillation of conduction electrons in plasmonic nanomaterials allows the coupling of propagating light waves with nanoscale volumes of matter (,hot spotsŠ) and allows engineering their optical response from the UV to THz as a function ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915202

19. Performance Metrics for Evaluating Object and Human Detection and Tracking Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7972
Topic: Materials Science
Published: 7/31/2014
Authors: Afzal A Godil, Roger V Bostelman, William P Shackleford, Tsai Hong Hong, Michael O Shneier
Abstract: In this report, we provide an overview of various performance evaluation metrics for object detection and tracking for robot safety applications in smart manufacturing. We present four different types of performance evaluation metrics based on detect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914820

20. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Materials Science
Published: 7/23/2014
Authors: Nathan Daniel Orloff, Jan Obrzut, Christian John Long, Thomas Fung Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series