NIST logo

Publications Portal

You searched on:
Topic Area: Materials Science

Displaying records 371 to 380 of 512 records.
Resort by: Date / Title


371. In Situ Ultra-Small-Angle X-Ray Scattering Study of the Solution-Mediated Formation and Growth of Nanocrystalline Ceria
Topic: Materials Science
Published: 1/16/2008
Authors: Andrew John Allen, Vincent A Hackley, P R Jemian, Jan Ilavsky, J M Raitano, S W Chan
Abstract: A remote-controlled isothermal circulating fluid flow cell is described and results presented for the in situ ultra-small-angle x-ray scattering (USAXS) study of solution-mediated systems and suspensions. The fluid flow prevents settling out of coars ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850995

372. Dynamic Force Measurement: Instrumented Charpy Impact Testing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6652
Topic: Materials Science
Published: 1/1/2008
Authors: Christopher N McCowan, Jolene D Splett, E. Lucon
Abstract: The maximum forces measured by the machines in this round robin are in good agreement. This general result shows that the static force calibration of instrumented strikers is quite robust, and that the various striker designs evaluated here performed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50616

373. Fast automatic registration of range images from 3D imaging systems using sphere targets
Topic: Materials Science
Published: 1/1/2008
Authors: Marek Franaszek, Geraldine S Cheok, Christoph Johann Witzgall
Abstract: 3D imaging systems are line of sight instruments and multiple scans from different locations are often needed to get a good representation of an entire scene. Therefore, registration of different datasets to a common coordinate system is required. A ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860690

374. ON LINE MONITORING SYSTEM - AN APPLICATION FOR MONITORING KEY WELDING PARAMETERS OF DIFFERENT WELDING PROCESSES
Topic: Materials Science
Published: 11/16/2007
Authors: Thomas Allen Siewert, Ivan Samard¿i¿,, Zvonimir Kolumbi
Abstract: This paper describes the application of an on-line monitoring system for the monitoring, aquisition and processing of key welding parameters. The on-line monitoring system has been successfully applied in practice to measure key welding parameters fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50624

375. Mesoporous Silica Films with Long-Range Order Prepared from Strongly Segregated Block Copolymer/Homopolymer Blend Templates
Topic: Materials Science
Published: 10/24/2007
Authors: Vijay Tirumala, R A. Pai, Sumit Agarwal, Curran Chandler, Gaurav Bhatnagar, Alvin Omang, Eric K Lin, J J. Watkins
Abstract: Well ordered mesoporous silica films were prepared by infusion and selective condensation of Si alkoxides within pre-organized block copolymer/homopolymer blend templates using supercritical CO2 as the delivery medium. The morphologies of mesoporou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852651

376. Chemical Bonding and Many-Body Effects in Site-Specific X-ray Photoelectron Spectra of Corundum V2O3
Topic: Materials Science
Published: 10/1/2007
Authors: Joseph C Woicik, M Yekutiel, E J. Nelson, N Jacobson, P Pfalzer, L Kronik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854384

377. Raman Spectroscopy of n-Type and p-Type GaSb with Multiple Excitation Wavelengths
Topic: Materials Science
Published: 10/1/2007
Authors: James E Maslar, Wilbur S. Hurst, C Wang
Abstract: The interpretation of Raman spectra of GaSb can be complicated by the presence of a so-called surface space-charge region (SSCR), resulting in an inhomogeneous near-surface Raman scattering environment. To fully interpret Raman spectra, it is i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902678

378. Evaluation of Thin Film Mechanical Properties by Means of Electrical Test Methods
Topic: Materials Science
Published: 9/30/2007
Authors: Nicholas Barbosa, Robert R Keller, David Thomas Read, Richard P. Vinci
Abstract: The ability to measure the mechanical properties of thin films and small scale structures is essential in designing reliable components at the micro- and nano-scales. It is known that the mechanical properties of thin film materials deviate from rela ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50339

379. Tunable Ionic-Conductivity of Collapsed Sandia Octahedral Molecular Sieves (SOMS)
Topic: Materials Science
Published: 9/12/2007
Authors: Jason D Pless, Terry J Garino, James E Maslar, Tina M Nenoff
Abstract: The structure-property relationship between atomic cation substitution and bulk scale conductivity in perovskites has been studied systematically. A series of Na-Nb perovskites has been synthesized via two methods (1) ion-exchange or (2) synthetic me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830985

380. Benefit-Cost Analysis of Residential Fire Sprinkler Systems
Series: NIST Interagency/Internal Report (NISTIR)
Topic: Materials Science
Published: 9/2/2007
Authors: David T Butry, M H. Brown, S Fuller
Abstract: This report documents a benefit-cost analysis performed to measure the expected present value of net benefits resulting from the installation of a multipurpose network fire sprinkler system in a newly-constructed, single-family house. The benefits an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860105



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series