Ritchie, N.
(2005),
A New Monte Carlo Application for Complex Sample Geometries, Surface and Interface Analysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=831377
(Accessed May 19, 2024)
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A New Monte Carlo Application for Complex Sample Geometries
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Citation
Surface and Interface Analysis
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Journals
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Keywords
backscatter, electron beam, electron probe microanalysis, electron transport, Monte Carlo, SEM, spectrometry, x-ray
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Created November 1, 2005, Updated February 19, 2017