Gu, D.
, Jargon, J.
, Ryan, M.
and Hubrechsen, A.
(2020),
Noise Influence on Scattering-Parameter Measurements, IEEE Transactions on Microwave Theory and Techniques
(Accessed May 19, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Noise Influence on Scattering-Parameter Measurements
Published
Author(s)
, , , Anouk Hubrechsen
Abstract
We present a general model of noise-influenced scattering (S) parameter measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise appears like a complex Gaussian quotient. The statistical analysis of the residual error is given and various statistical quantities and distributions are derived. Experiments were conducted on a two-port VNA to validate the noisy S-parameter model. It was shown that the uncertainty due to the noise is often critical in S-parameter measurements, in particular for S-parameters of a small magnitude.Citation
IEEE Transactions on Microwave Theory and Techniques
Pub Type
Journals
Keywords
Network analysis, noise, probability distribution, random variable, scattering parameter, uncertainty.
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created November 3, 2020, Updated November 4, 2020