NIST logo
NIST Home > Materials Science Semiconductor Materials Programs and Projects 
 

Materials Science Semiconductor Materials Programs and Projects

(showing 1 - 13 of 13)
Thin Film Electronics
Last Updated Date: 09/23/2014

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Analytical Transmission Scanning Electron Microscopy
Last Updated Date: 09/02/2014

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Defect Structures and Electronic Properties of Graphene
Last Updated Date: 05/21/2014

Graphene and related materials have remarkable physical properties, such as high carrier mobilities. These properties provide many opportunities … more

COMPLETED: Polymers for Next-Generation Lithography
Last Updated Date: 04/16/2014

Our goal is to develop measurement methods with sufficiently high spatial resolution to uncover the materials limitations in the resolution of … more

Semiconductor Nanowire Metrology: Electronics, Photonics, and Sensors
Last Updated Date: 04/16/2014

In this project, we are developing metrology needed for the synthesis, processing, and characterization of semiconductor nanowire structures to … more

Nanostructure Fabrication Processes
Last Updated Date: 04/16/2014

In this project we are developing in situ measurements relevant to the electrochemical fabrication, processing, and application of nanostructured … more

Strain Mapping and Simulation
Last Updated Date: 07/18/2013

We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal … more

Strain fields and phase distribution maps of indented Si
Last Updated Date: 07/16/2013

In Raman-spectroscopy enhanced IIT, an indentation device that is coupled with a Raman microscope to conduct in situ spectroscopic and optical … more

Measuring Topological Insulator Surface State Properties
Last Updated Date: 04/26/2013

The transmission of information in today’s electronics requires the movement of electrical charge, which expends energy and generates heat, … more

Thin Film X-Ray Reflectometry
Last Updated Date: 10/09/2012

Our goal is to develop Standard Reference Materials (SRMs) and quantitative, reproducible X-ray reflectometry (XRR) data analysis methods to … more

Theory and Modeling of Materials for Renewable Energy
Last Updated Date: 07/12/2012

Renewable energy sources such as solar energy are attractive alternatives to fossil fuels because of their abundant supply and pollution-free power … more

Light-matter Interactions in Semiconductor Nanostructures
Last Updated Date: 05/30/2012

The quantum optics of light interacting with semiconductor-based nanostructures is being studied to extend concepts of entanglement and coherence … more

Designing the Nanoworld: Nanostructures, Nanodevices, and Nanooptics
Last Updated Date: 05/30/2012

Nanoscale theory of the electronic, optical and mechanical properties of ultrasmall structures, devices and their dynamical operation and the … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070