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Semiconductors Portal

Programs and Projects
Nanoelectronic Device Metrology

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

CMOS Device and Reliability

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

MEMS Measurement Science and Standards

Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more

Back-End-of-Line Reliability Metrology Development

The Back-End-of-Line (BEOL) Reliability Metrology Development project aims to develop the metrology to enable quantitative and mechanistic … more

Thin Film Electronics

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Acoustics and Vibration

The Acoustics and Vibration Project provides measurement services, and develops measurements and documentary standards for the SI units of … more

Instruments
Scanning Auger Microprobe

A JEOL model 7830F field emission source, scanning Auger microscope. more

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Contact

General Information:
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inquiries@nist.gov

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