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Semiconductors Portal

Programs and Projects
Novel Sources for Focused-ion Beams

Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. In the CNST, researchers are … more

Micro- and Nanoelectromechanical Systems

Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more

Acceleration, Vibration, and Acoustics

The Acceleration, Vibration, and Acoustics Project provides measurement services, and develops measurements and documentary standards for the SI … more

Nanoscale Stress Measurements and Standards

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Analytical Transmission Scanning Electron Microscopy

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Quantum Materials and Devices

Quantum coherent materials have become important in magnetic sensors as well as information processing technology. For magnetic sensors, … more

Instruments
Scanning Auger Microprobe

A JEOL model 7830F field emission source, scanning Auger microscope. more

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Contact

General Information:
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inquiries@nist.gov

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Gaithersburg, MD 20899-1070