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Scientists Shed Light on Organic Photovoltaic Characteristics
Release Date: 09/02/2014

Organic photovoltaic sample under test. (Click image to enlarge.) Photovoltaic devices, also kno more

PML Leadership Prominent Throughout Newly Released ITRS
Release Date: 04/24/2014

George Orji, PML's Semiconductor and Dimensional Metrology Division When the semiconductor industry received the eagerly awaited annual update of … more

MML Researcher R. Joseph Kline Receives Presidential Early Career Award for Scientists and Engineers
Release Date: 01/15/2014

Material Measurement Laboratory researcher R. Joseph Kline was recently named among the 102 recipients of the Presidential Early Career Awards for … more

NIST Chip Measurement Advance Earns 'Oscar of Innovation'
Release Date: 07/12/2013

A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 … more

Microscopy Technique Could Help Computer Industry Develop 3-D Components
Release Date: 06/25/2013

A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has … more

Nanoelectronics Conference Will Focus on Semiconductor Industry's Future
Release Date: 03/05/2013

How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 … more

NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
Release Date: 09/05/2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer … more

September Workshop to Explore the Measurement Needs of the Flexible Electronics Industry
Release Date: 09/05/2012

The National Institute of Standards and Technology (NIST), in concert with the FlexTech Alliance, will hold a workshop on “Flexible Printed … more

PML Uses Combined Optical Techniques to Provide Important Answers on Graphene Structures
Release Date: 08/13/2012

Nhan Nguyen demonstrates how he performs optical measurements on a graphene-insulator-semiconductor sample structure. That graphene is the hot new … more

Researchers Demonstrate and Explain Surface Conduction in a Topological Insulator
Release Date: 07/11/2012

Researchers at the University of Maryland and the NIST Center for Nanoscale Science and Technology have for the first time experimentally … more

Shaffique Adam Receives Singapore National Research Foundation Fellowship
Release Date: 06/27/2012

In July, Shaffique Adam will join the inaugural faculty of Yale-NUS College as an Assistant Professor of Science, with a joint appointment in the … more

NIST Announces $2.6 Million in Funding for Novel Semiconductor Research
Release Date: 03/20/2012

The National Institute of Standards and Technology (NIST) is soliciting proposals to support long-term research in next-generation semiconductor … more

NIST Reveals Switching Mechanism in Promising Computer Memory Device
Release Date: 02/21/2012

Sometimes knowing that a new technology works is not enough. You also must know why it works to get marketplace acceptance. New information from … more

Laying the Groundwork for 3D Stacked Integrated Circuits
Release Date: 02/17/2012

Graphical representation of a stack of individual chips connected by vertical pipelines or through-silicon vias (TSVs). Credit: IBM. Could … more

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