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NIST Home > Semiconductors Programs and Projects 
 

Semiconductors Programs & Projects

(showing 1 - 15 of 25)
CMOS Device and Reliability
Last Updated Date: 05/27/2016

  The CMOS Device and Reliability Project aims to develop new metrology tools for characterizing high-performance complementary … more

Metrology and Synthesis of 3D Nanostructures
Last Updated Date: 05/25/2016

We synthesize semiconductor nanostructures to serve both as test structures for measurement techniques and as building blocks for novel metrology … more

Smart Grid Interoperability Testbed Facility
Last Updated Date: 05/04/2016

NIST is charged by the 2007 Energy Independence and Security Act (EISA) with facilitation of interoperability standards to enable successful … more

Power Conditioning Systems for Renewables, Storage, and Microgrids
Last Updated Date: 05/04/2016

This project develops the measurement science necessary to support the widespread use of advanced power electronics to provided new … more

Thin Film Electronics
Last Updated Date: 04/25/2016

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and … more

Novel materials for enhancing spin information
Last Updated Date: 01/04/2016

Most computing technology relies on the presence or absence of charge to represent binary information during computation. Limitations in reducing … more

Enriching Silicon-28 to >99.9999% for Quantum Information
Last Updated Date: 10/29/2015

Within the field of quantum computing research, silicon wafers have been identified as a natural substrate on which to form qubits using gate … more

Nanostructure Fabrication and Metrology
Last Updated Date: 10/13/2015

Single photons are the fundamental particles for all optical measurements. Single photon detectors made from avalanche photodiodes or … more

Quantum Processing
Last Updated Date: 10/05/2015

Quantum coherent materials have become important in magnetic sensors as well as information processing technology. For magnetic sensors, … more

Theory of the optical properties of materials
Last Updated Date: 09/09/2015

The overarching objective of this project is reliably calculating the bulk optical properties of materials, such as complex index of refraction, … more

Nanoelectronic Device Metrology
Last Updated Date: 08/25/2015

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable innovation and advanced … more

Acceleration, Vibration, and Acoustics
Last Updated Date: 06/25/2015

The Acceleration, Vibration, and Acoustics (AVA) Project advances the measurement science, develops standards, and provides calibration services … more

Micro- and Nanoelectromechanical Systems
Last Updated Date: 05/26/2015

Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical … more

Back-End-of-Line Reliability Metrology
Last Updated Date: 05/19/2015

This project aims to develop the metrology to enable quantitative assessment of performance limiting reliability issues in emerging electronic … more

Novel Sources for Focused-ion Beams
Last Updated Date: 02/23/2015

Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. In the CNST, researchers are … more

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