Scanning Tunneling Microscopy (STM) Information at NIST

  • 'Tuning' Graphene Drums Might Turn Conductors to Semiconductors

  • Atom Manipulation with the Scanning Tunneling Microscope

  • Atom-Based Dimensional Metrology

  • Atomic Scale Characterization and Manipulation Laboratory

  • Atomic Scale Quantum Nanoelectronics Laboratory

  • CNST Graphene Publications

  • CNST Releases the Spring 2012 Edition of The CNST News

  • CNST Releases the Summer 2012 Edition of The CNST News

  • Daniel Pierce

  • Defect in Graphene May Present Bouquet of Possibilities

  • Designing Advanced Scanning Probe Microscopy Instruments

  • Electronic Nanodevices Laboratory

  • Forensic Topography and Surface Metrology

  • Frank W. Gayle

  • General Interest

  • Graphene Drumheads Tuned to Make Quantum Dots

  • James Kushmerick

  • Joseph Stroscio

  • Jungpil Seo

  • Key Property of Graphene Sustained Over Wide Ranges of Density and Energy

  • Measuring the Magneto-Electronic Properties of Graphene on the Nanometer Scale

  • Measuring Topological Insulator Surface State Properties

  • Metrology of High Current Density Electron Field Emitters

  • NIST Researchers Holding Steady in an Atomic-Scale Tug-of-War

  • NIST Researchers Put a New Spin on Atomic Musical Chairs

  • NIST’s New Scanning Probe Microscope is Supercool

  • Optical Methods for 3-D Nanostructure Metrology

  • Optoelectrical Characterization of Nanostructured Photovoltaic Materials and Devices

  • Pedram Roushan

  • Probing Graphene Electronic Devices with Atomic Scale Measurements

  • Real-World Graphene Devices May Have a Bumpy Ride

  • Researchers Develop Versatile Optomechanical Sensors for Atomic Force Microscopy

  • Scanning Tunneling Microscope

  • Seeing Moiré in Graphene

  • Shaffique Adam Receives Singapore National Research Foundation Fellowship

  • Steve Blankenship

  • Structure, Defects, and Scattering in Graphene

  • Traceable Scanning Probe Nano-Characterization

  • Young Kuk