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Perched atop a high plateau in Chile’s Atacama Desert, a long-awaited observatory is beginning to take shape: the largest suite of ground-based telescopes
A single-atom-thick sheet of carbon known as graphene has remarkable properties on its own, but things can get even more interesting when you stack up multiple
Our team is focusing on developing reliable methods to characterize DAC materials for longevity and stability. We are currently focusing on aminosilane-silica
NIST’s Material Measurement Laboratory and Physical Measurement Laboratory are developing a first-of-kind X-ray testbed for operando monitoring of catalytic
NIST’s Material Measurement Laboratory and Communications Technology Laboratory are developing a new spectroscopy for intermolecular interactions. The team is
The mission of the Micro and Nanoplastic (MNP) Metrology Project is to assist regulators in assessing the human health and environmental risks associated with
Ann Chiaramonti Debay, Daniel Schreiber, Karen Kruska, Kayla Yano
Atom probe tomography (APT) is a powerful analytical technique whose strengths lie in its combination of three-dimensional reconstructions, (sub)nanometer
Apparent negative crack growth is often encountered when performing elastic-plastic fracture toughness tests with the Elastic Compliance single-specimen
Organic thin films are of great interest due to their intriguing interfacial and functional properties, especially for device applications such as thin-film
CLIP is an analysis program for fluorescence lifetime images. It provides the user with the ability to fit or calculate the phasor plots for lifetime decays
LEAP 4000X Si/HR Imaging time-of-flight mass spectrometer and field ion microscope. Can deliver 3-D, isotopically- and chemically- resolved images Sub-nanometer
This in-situ indentation system can be integrated into electron microscopes as well as being run in other unusual setups. With a load capacity of 150 mN, this
A TESCAN MIRA3 Schottky field-emission scanning electron microscope with 4 30 mm 2 silicon x-ray drift detectors which has been automated for particle and
The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from hundreds to