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Electronics & Telecommunications Programs & Projects

(showing 1 - 15 of 82)
Magnetic Nanostructures for Post-Complimentary Metal-Oxide Semiconductor (CMOS) Electronics
Last Updated Date: 01/30/2015

Just as integrated electronic circuits continue to pack on more and ever tinier components, so magnetic technologies for data storage and other … more

Low Temperature Regenerator and Pulse Tube Losses
Last Updated Date: 01/28/2015

The Cryogenic Technologies Project has been funded by ONR since FY2005 to measure and model the losses in 4 K regenerators and pulse tubes. These … more

Thin Film and Interconnect Reliability
Last Updated Date: 01/28/2015

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such … more

Spectrum Sharing
Last Updated Date: 01/26/2015

Spectrum sharing research in the Communications Technology Laboratory (CTL) is motivated by national priorities to expand the availability of … more

Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
Last Updated Date: 01/22/2015

Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with … more

Optical Characterization of Advanced Thin Films
Last Updated Date: 01/22/2015

A wide range of technologies are impacted by the performance of thin (<100 nm) layers of advanced materials. This is particularly true in the … more

Fatigue in Silicon
Last Updated Date: 01/22/2015

Our objective is to evaluate mechanisms of fatigue in bulk silicon, a material that has been traditionally considered to be immune to degradation … more

Nanocalorimetry Measurements
Last Updated Date: 01/22/2015

To develop nanocalorimetry as a method for measuring heats of reaction of nanoscale samples with nanojoule sensitivity in order to detect … more

Nanoscale Strength Measurements and Standards
Last Updated Date: 01/22/2015

To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) … more

Nanoscale Stress Measurements and Standards
Last Updated Date: 01/22/2015

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Plasma Process Metrology
Last Updated Date: 01/20/2015

Our multifaceted program provides numerous outputs to assist our customers. First, we develop and evaluate a variety of measurement techniques … more

Advanced IC Interconnects - Process Metrology and Models
Last Updated Date: 01/20/2015

The objective for Advanced IC Interconnects is to provide measurement standards and advanced measurement methods supporting metrology needs of the … more

MEMS Measurement Science and Standards
Last Updated Date: 01/20/2015

Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more

Metrology of the Ohm
Last Updated Date: 01/14/2015

Resistance standards traceable to NIST provide references for measurements of current at levels from 2000 A to below 1 pA and are used to support … more

Electronic Kilogram
Last Updated Date: 01/14/2015

This project provides the basis for a new definition of mass, based on unchanging quantum properties of nature rather than a physical artifact. … more

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