@misc{1178201,
  author = {K P Roenker},
  title = {An NMOS test chip for a course in semiconductor parameter measurements:},
  year = {1984},
  month = {1984-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.IR.84-2822},
  language = {en},
}