@misc{1186251,
  author = {J C Humphreys and S E Chappell},
  title = {Radiation-hardness testing of electronic devices ::a survey of facility dosimetry practices},
  year = {1976},
  month = {1976-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.IR.76-1135},
  language = {en},
}