@misc{1190356,
  author = {W Robert Thurber and David C Lewis and W Murray Bullis},
  title = {Resistivity and carrier lifetime in gold-doped silicon:},
  year = {1973},
  month = {1973-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.IR.73-128},
  language = {en},
}