@misc{1197691,
  author = {David L Duewer and David L Duewer and Reenie M Parris and Edward V White and Willie E May and Howard Elbaum},
  title = {An approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials:},
  year = {2004},
  month = {2004-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NIST.SP.1012},
  language = {en},
}