@conference{1246126,
  author = {Rick Candell and Yongkang Liu and Mohamed Hany and Karl Montgomery and Sebti Foufou},
  title = {Smart Manufacturing Testbed for the Advancement of Wireless Adoption in the Factory},
  year = {2020},
  month = {2020-11-10 05:11:00},
  publisher = {IFIP 17th International Conference on Product Lifecycle, Rapperswil, CH},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930124},
  doi = {https://doi.org/10.1007/978-3-030-62807-9_15},
  language = {en},
}