@conference{1265511,
  author = {Florian Bergmann and Nicholas Jungwirth and Bryan Bosworth and Jason Killgore and Eric Marksz and Tomasz Karpisz and Meagan Papac and Anna Osella and Lucas Enright and Christian Long and Nathan Orloff},
  title = {Testing dielectric slab mode excitation, non-rectangular conductor profiles and edge roughness as sources of additional loss in mmWave transmission lines},
  year = {2023},
  month = {2023-07-28 04:07:00},
  publisher = {2023 IEEE/MTT-S International Microwave Symposium - IMS 2023, San Diego, CA, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936317},
  doi = {https://doi.org/10.1109/IMS37964.2023.10188190},
  language = {en},
}