@misc{1276316,
  author = {David Deisenroth and Jordan Weaver and Sergey Mekhontsev and Steven Grantham and Shawn P. Moylan},
  title = {Laser Beam Metrology for AM-Bench 2022: Approaches, Results, and Lessons Learned},
  year = {2025},
  month = {2025-04-01 04:04:00},
  publisher = {Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958616},
  doi = {https://doi.org/10.6028/NIST.AMS.100-67},
  language = {en},
}