@conference{134651,
  author = {James Baker-Jarvis},
  title = {RF Materials Characterization Metrology at NBS/NIST: Past and Recent Work, Future Directions and Challenges},
  year = {2001},
  month = {2001-10-14},
  publisher = {Conf. Electrical Insulation Dielectric Meas., KITCHENER, CA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29176},
  language = {en},
}