@conference{154191,
  author = {Nien Zhang and N Sedransk and Dean Jarrett},
  title = {Statistical Uncertainty Analysis of CCEM-K2 Comparisons of Resistance Standards},
  year = {2002},
  month = {2002-06-01},
  publisher = {2002 Conference on Precision Electromagnetic Measurements  (CPEM 2002) and IEEE Transactions on Instrumentation and Measurements, Ottawa, },
  language = {en},
}