@article{168141,
  author = {David Black and Joseph Woicik and M Erdtmann and M Currie},
  title = {Imaging Defects in Strained Silicon Thin Films by X-ray Topography},
  year = {2006},
  number = {88},
  month = {2006-05-29},
  publisher = {Applied Physics Letters},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854299},
  language = {en},
}