@article{172241,
  author = {Zachary Levine and A Kalukin and M Kuhn and S Frigo and I McNulty and C Retsch and Y Wang and Uwe Arp and Thomas Lucatorto and Bruce Ravel and Charles Tarrio},
  title = {Tomography of Integrated Circuit Interconnect With an Electromigration Void},
  year = {2000},
  number = {87},
  month = {2000-05-01},
  publisher = {Journal of Applied Physics},
  language = {en},
}