@conference{200911,
  author = {M. Young},
  title = {Objective measurement and characterization of scratch standards},
  year = {1983},
  number = {362},
  month = {1983-03-01},
  publisher = {Proc. Intl. Soc. for Optical Engineering (SPIE)},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=12626},
  language = {en},
}