@article{231926,
  author = {Liangchun Yu and Greg Dunne and Kevin Matocha and Kin Cheung and John Suehle and Kuang Sheng},
  title = {Reliability Issues of SiC MOSFETs: A Technology for High Temperature Environments},
  year = {2010},
  month = {2010-09-20},
  publisher = {IEEE Transactions on Device and Materials Reliability},
  language = {en},
}