@conference{754186,
  author = {T. Souders and Gerard Stenbakken and Hans Engler},
  title = {Efficient Testing of Electronic Devices},
  year = {1998},
  number = {29},
  month = {1998-09-01 00:09:00},
  publisher = {Computing Science and Statistics - Mining and Modeling massive Data Sets in Science, Engineering, and Business with a Subtheme in Environmental Statistics, Houston, TX, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32677},
  language = {en},
}