@conference{759971,
  author = {Y Chen and John Suehle and Chien-Chung Shen and J Bernstein and C. Messick and P Chaparala},
  title = {The Correlation of Highly Accelerated Q<sub>bd</sub> Tests to TDDB Life Tests for Ultra-Thin Gate Oxides},
  year = {1998},
  month = {1998-06-01 00:06:00},
  publisher = {Proc., 1998 International Reliability Physics Symposium, Reno, NV, USA},
  language = {en},
}