@misc{763836,
  author = {James Ehrstein and C Croarkin},
  title = {Standard Reference Materials: The Certification of 100 mm Diameter Silicon Resistivity SRMs 2541 through 2547 Using Dual-Configuration Four-Point Probe Measurements},
  year = {1999},
  number = {260},
  month = {1999-06-01 00:06:00},
  publisher = {Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD},
  language = {en},
}