@conference{765581, author = {H. Huff and Curt Richter and M. Green and G. Lucovsky and T. Hattori}, title = {Ultrathin SiO2 and High-K Materials for ULSI Gate Dielectrics}, year = {1999}, month = {1999-09-01 00:09:00}, publisher = {Proc., Mater. Res. Soc. Symp. , Pittsburgh, PA, USA}, language = {en}, }