@article{768331,
  author = {Eric Vogel and W. Henson and Curt Richter and John Suehle},
  title = {Limitations of Conductance to the Measurement of the Interface State Density of MOS Capacitors with Tunneling Gate Dielectrics},
  year = {2000},
  number = {47},
  month = {2000-03-01 00:03:00},
  publisher = {IEEE Transactions on Electron Devices},
  language = {en},
}