@conference{769696,
  author = {S. Menon and J. Fazekas and Jochen von Hagen and Linda Head and Colleen Hood and Harry Schafft},
  title = {Impact of Test-Structure Design and Test Methods for Electromigration Testing},
  year = {2000},
  month = {2000-03-01 00:03:00},
  publisher = {1999 IIEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA},
  language = {en},
}