@conference{773481,
  author = {Da-Wei Heh and Eric Vogel and J Bernstein},
  title = {New Insights into Threshold Voltage Shifts for Ultrathin Gate Oxides},
  year = {2004},
  month = {2004-10-15 00:10:00},
  publisher = {IEEE International Integrated Reliability Workshop Final Report, Fallen Leaf, CA, USA},
  language = {en},
}