@conference{776501,
  author = {Santos Mayo and J Lowney and Peter Roitman},
  title = {Measurement of Interface Defects in Gated SIMOX Structures},
  year = {1991},
  month = {1991-12-31 00:12:00},
  publisher = {Proc., 1991 IEEE International SOI Conference, Vail Valley, CO, USA},
  language = {en},
}