@conference{776561,
  author = {P Chi and David Simons and Peter Roitman},
  title = {Artifacts Observed in Oxygen Profiles of SIMOX Samples by Secondary Ion Mass Spectrometry},
  year = {1988},
  month = {1988-12-31 00:12:00},
  publisher = {Microbeam Analysis - l988, Proc. 22nd Annual Conf. Materials Analysis Society, Milwaukee, WI, USA},
  language = {en},
}