@misc{778801,
  author = {Stephen Knight and A Settle-Raskin},
  title = {National Semiconductor Metrology Program, Project Portfolio, FY 1998},
  year = {1998},
  month = {1998-03-01 00:03:00},
  publisher = {NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD},
  language = {en},
}