@misc{779141,
  author = {C. Schuster},
  title = {Semiconductor Measurement Technology: Test Structure Implementation Document: DC Parametric Test Structures and Test Methods for Monolithic Microwave Integrated Circuits (MMICs)},
  year = {1995},
  month = {1995-08-01 00:08:00},
  publisher = {Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD},
  language = {en},
}