@conference{779751,
  author = {John Suehle and P Chaparala},
  title = {Time-Dependent Dielectric Breakdown in Thin Intrinsic SiO<sub>2</sub> Films},
  year = {1995},
  month = {1995-12-31 00:12:00},
  publisher = {Proc., Materials Research Society Symposium, Pittsburgh, PA, USA},
  language = {en},
}