@conference{781601,
  author = {Baozhong Zhu and John Suehle and Y Chen and J Bernstein},
  title = {Negative Bias Temperature Instability of Deep Sub-Micron p-MOSFETs Under Pulsed Bias Stress},
  year = {2002},
  month = {2002-10-21 00:10:00},
  publisher = {Proc., Integrated Reliability Workshop, Lake Tahoe, CA, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30882},
  language = {en},
}