@conference{794641,
  author = {Joseph Kopanski and David Blackburn and George Harman and David Berning},
  title = {Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits},
  year = {1991},
  month = {1991-12-31 00:12:00},
  publisher = {Proc., First International High Temperature Electronics Conference, Albuquerque, NM, USA},
  language = {en},
}