@article{795731,
  author = {John Suehle and Baozhong Zhu and Yuan Chen and J Bernstein},
  title = {Detailed Study and Projection of Hard Breakdown Evolution in Ultra-Thin Gate Oxides},
  year = {2005},
  number = {45},
  month = {2005-02-28 00:02:00},
  publisher = {Microelectronics Reliability},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31833},
  language = {en},
}