@article{818451,
  author = {Thenappan Chidambaram and Dmitry Veksler and S Madisetti and Michael Yakimov and Vadim Tokranov and Serge Oktyabrskiy},
  title = {InGaAs Inversion Layer Mobility and Interface Trap Density from Gated Hall Measurements},
  year = {2016},
  month = {2016-12-12 00:12:00},
  publisher = {IEEE Electron Device Letters},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921462},
  language = {en},
}