@conference{846426,
  author = {D. Khera and Michael Cresswell and Loren Linholm and G. Ramanathan and J. Buzzeo and A. Nagarajan},
  title = {Knowledge Extraction Techniques for Expert System Assisted Wafer Screening},
  year = {1990},
  month = {1990-12-31 00:12:00},
  publisher = {Proc., International Semiconductor Manufacturing Science Symposium, Burlingame, CA, USA},
  language = {en},
}