@article{847276,
  author = {S. Smee and Michael Gaitan and Donald Novotny and Yogendra Joshi and David Blackburn},
  title = {IC Test Structures for Multi-Layer Interconnect Stress Determination},
  year = {2000},
  number = {21},
  month = {2000-01-01 00:01:00},
  publisher = {IEEE Electron Device Letters},
  language = {en},
}