TY  - CONF
AU  - Kennedy, Michael
AU  - Davies, Matthew
AU  - Yoon, Howard
AU  - Burns, Timothy
C2  - International Conference on Thermal Sensing and Imaging Diagnostic Applications: Thermosense XXII, Orlando, FL
DA  - 2000-04-01
LA  - en
M1  - 4020
PB  - International Conference on Thermal Sensing and Imaging Diagnostic Applications: Thermosense XXII, Orlando, FL
PY  - 2000
TI  - Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining
ER  -