TY  - JOUR
AU  - Unguris, John
AU  - Tulchinsky, D
AU  - Kelley, Michael
AU  - Borchers, Julie
AU  - Dura, Joseph
AU  - Majkrzak, Charles
AU  - Hsu, S.
AU  - Loloee, R
AU  - Pratt, W
AU  - Bass, J
C2  - Journal of Applied Physics
DA  - 2000-05-01
LA  - en
M1  - 87
PB  - Journal of Applied Physics
PY  - 2000
TI  - Magnetic Depth Profiling Co/Cu Multilayers to Investigate Magnetoresistance
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620521
ER  -