TY  - CONF
AU  - Pratt, Jon
AU  - Kramar, John
AU  - Shaw, Gordon
AU  - Gates, Richard
AU  - Rice, Paul
AU  - Moreland, John
C2  - NSTI Nanotechnology Conference and Trade Show 2006, Boston, MA
DA  - 2006-01-01
LA  - en
PB  - NSTI Nanotechnology Conference and Trade Show 2006, Boston, MA
PY  - 2006
TI  - New Reference Standards and Artifacts for Nanoscale Physical Property Characterization
ER  -