TY  - JOUR
AU  - Oleshko, Vladimir
AU  - Williams, Elissa
AU  - Davydov, Albert
AU  - Krylyuk, Sergiy
AU  - Motayed, Abhishek
AU  - Ruzmetov, Dmitry
AU  - Lam, Thomas
AU  - Lezec, Henri
AU  - Talin, Albert
C2  - Journal of Physics Conference Proceedings
DA  - 2013-10-02
DO  - https://doi.org/10.1088/1742-6596/471/1/012017
LA  - en
M1  - 012017
PB  - Journal of Physics Conference Proceedings
PY  - 2013
TI  - Analytical Electron Microscopy of Semiconductor Nanowire Functional Materials and Devices for Emerging Applications.
ER  -