TY  - JOUR
AU  - Bertness, Kristine
AU  - Kramer, C
AU  - Olson, J
AU  - Moreland, John
C2  - Journal of Electronic Materials
DA  - 1994-01-01
LA  - en
M1  - 23(2)
PB  - Journal of Electronic Materials
PY  - 1994
TI  - In Situ Observation of Surface Morphology of InP Grown on Singular and Vicinal (001) Substrates
ER  -