TY  - CONF
AU  - Michaels, Chris
AU  - Richter, Lee
AU  - Cavanagh, Richard
AU  - Stranick, Stephan
C2  - Optical Devices and Diagnostics in Materials Science, Conference | | Optical Devices and Diagnostics in Materials Science | SPIE, San Diego, CA
DA  - 2000-10-01
LA  - en
M1  - 4098
PB  - Optical Devices and Diagnostics in Materials Science, Conference | | Optical Devices and Diagnostics in Materials Science | SPIE, San Diego, CA
PY  - 2000
TI  - Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy
ER  -