TY  - JOUR
AU  - Mahoney, Christine
AU  - Fahey, Albert
AU  - Gillen, John
C2  - Analytical Chemistry
DA  - 2007-02-01
LA  - en
PB  - Analytical Chemistry
PY  - 2007
TI  - Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
ER  -