TY  - CONF
AU  - Michaels, Chris
AU  - Dentinger, C
AU  - Richter, Lee
AU  - Chase, D
AU  - Cavanagh, Richard
AU  - Stranick, Stephan
C2  - Optical Devices and Diagnostics in Materials Science, Conference | | Optical Devices and Diagnostics in Materials Science  | SPIE, San Diego, CA
DA  - 2000-09-01
LA  - en
M1  - 4098
PB  - Optical Devices and Diagnostics in Materials Science, Conference | | Optical Devices and Diagnostics in Materials Science  | SPIE, San Diego, CA
PY  - 2000
TI  - Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy
ER  -